IS 12970 ( Part G/Set 1 ) : 1992 ( Reaffirmed 2006 ) Indian Standard SEMICONDUCTOR DEVICES INTEGRATED CIRCUITS PART 6 ANALOGUE INTEGRATED Section 1 CIRCUITS, General MEASURING METHODS UDC 621.3.049.77.037-33 @ BIS 1992 BUREAU MANAK OF BHAVAN, INDIAN STANDARDS ZAFAR MARG * Price Group 2 9 BAHADUR SHAH NEW DELHI 110002 May 1992 Semiconductor Devices and Integrated Circuits Sectional Committee, LT 10 FOREWORD This Indian Standard ( Part 6/Set 1 ) was adopted by the Bureau of Indian Standards, after the draft finalized by the Semiconductor Devices and Integrated Circuits Sectional Committee had been approved by the Electronics and Telecommunications Division Council. This standard is one of a series of Indian Standards on measuring methods of analogue This section of the standard deals with the general conditions, precautions integrated circuits. to be taken, etc, in making measurements on analogue integrated circuits. This section is expected to serve as a guide to the subsequent parts on measuring methods of analogue Various sections of this part are: integrated circuits. Section Section Section Section 1 General 2 Linear 3 Voltage 4 Analogue amplifier regulator signal switching circuits methods of measurements for the various on essential ratings and characteristics it in Subsequent parts of this standard will cover detailed characteristics covered by the appropriate standards of analogue integrated circuits. When more than one methcd of measurement of a particular characteristic are described, is implied, that any one method will be suitable. These methods may vary considerably regard to accuracy desired, ease cf measurements, etc. While preparing this standard, assistance has been ctor devices, Integrated circuits Part 3 : Analogue national Electrotechnical Commission ( IEC ). derived from IEC Pub 748-3 `Semiconduintegrated circuits' issued by the Interstandard, accordance if the with In reporting the results of a test or analysis made in accordance with this final value, observed or calculated, is to be rounded off, it shall be done in IS 2 : 1960 `Rules for rounding off numerical values ( revised ).' IS 12970 ( Part C/Set 1) : 1992 Indian Standard SEMICONDUCTOR DEVICESINTEGRATED CIRCUITS PART 6 ANALOGUE INTEGRATED Section 1 CIRCUITS, General MEASURING METHODS 1 SCOPE This standard ( Part G/Set 1 ) provides general for requirements for measuring methods analogue integrated circuits. 2 REFERENCES The Indian Standards listed below are necessary adjuncts to this standard. IS No. 1885 ( Part 7/Set i971 . and definitions given in IS 1885 (Part 7/ Set 5 ) : 1971 and provisions of 3 of IS 12970 ( Part 1 ) : 1990 and IS 12970 ( Part S/Set 1 ) shall be applicable. 4 LETTER SYMBOLS For the purpose of this standard the letter symbols given in IS 3715 ( Part 1 ) : 1971 shall be applicable. 5 BASIC REQUIREMENTS Provisions of 6.1 of IS 12970 ( Part 1 ) : 1990 applies, unless otherwise stated. 6 SPECIFIC REQUIREMENTS relevant section Title Electrotechnical vocabulary: 5 ) : Part 7 Semiconductor devices, Section 5 Integrated circuits and microelec%-onics Letter symbols for semi3715 Part 1 devices: ( Part 1 ) : 1971 conductor General aspects devices $emiconductor 12970 circuits : Part 1 ( Part 1 ) : 1990 Integrated General devices Semiconductor 12970 circuits : Part 5 ( Part 5/&c 1 ) Integrated Analogue integrated circuits Esential ratings and characteristics, Section 1 General 3 TERMINOLOGY For the purpose of this standard, the terms They are indicated in the in the present publication. 7 APPLICATION MATRIX ( TABLE 1) This matrix indicates the applicability of each of the numbered measuring methods to the different sub-categories of analogue integrated circuits. Besides, the matrix indicates where the measuring method has been described. This is given for guidance only. All tests indicated may not be applicable to all devices in a particular category. The relevant specification may be referred for applicable tests. IS 12970 ( Part 6/Set 1 ) : 1992 Table 1 Application Matrix for Measuring Methods ( Given in this Standard ) ( Clause 7 ) I Method No. Characteristics to be Measured I Operational p__ X X Categories, Sub-categories Amplifier eu$h$$, RF, IF Voltage Regulators -__ 22 _ I Anal' ogue Sig nal Switc hing Circ uits -- Power supply current 23 -_ Small-signal Output - input impedance _impedance aud X __-___ Input offset voltage bias voltage 24 25, 26 -_ -- -Input offset current 21 - -Input bias current 28 -_ 29 -_ Input offset voltage temperature coefficient Input offset current temperature coefficient -_ X 30 X -_ Open-loop voltage amplification Cut-off frequency ( frequencies ) X 31 -32 -- ___ X _Common-mode rejection rejection ratio ratio X _-' 33 -_ 34 - Supply voltage X I 2 IS 12970 ( Part 6/ Set 1 ) : 1992 Table 1 ( Continued ) Method No. Characteristics to be Measured Categoric, Sub-categories Amplifiers Operations ~-_~__ 35 Output voltage range (d. c. measurement only ) for differential amplifiers --__ 39 42 Response times input voltage X P-P-P 43 Short-circuit output current ( of an operational-amplifier Crosstalk altenuation multiple amplifiers ) ( for X ------P Upper limiting frequency for full output voltage swing Maximum rate of change of the output voltage ( slew rate ) Input bias current coefficient Cut-off frequency, frequency temperature X _________~~ unity-gain X X X -X ____--____--____ X ___~__~ 47 --_ X X ~X -) _--y44 -45 X X X X -P-PCommon-mode range X X Audio, video multichannel RF, IF Voltage Regulators Analogue Signal Switching Circuits X X 46 55 . 3 IS 12970 ( Part 6/ Set 1) : 1992 Table 1 ( Concluded ) Method No. Characteristics to be Measured Categories, Amplifiers Operations Input regulation coefficient ------P-____---P--__ 13 Ripple ~~____._________ 14 rejection 12 stabilization X ratio _--~.__~___ X X X Audio, video multichannel RF, IF Sub-categories Voltage Analogue Signal Switching Circuits IRegulators I I Load regulation/stabilization coefficient ~~----~~---__-____ 15 --.-. 16 Output noise voltage --~~_---________-__.~_ Temperature coefficient of regulated output voltage L__-P_----p-_ Stand-by current ( quiescent Current ) ---c--~__----______ Short-circuit Reference current -------___ voltage to changes X _~-~ 17 X X X 18 19 20 - ~~-~_______-__I______ - PP_---PP----p-__ Transient response of input voltage ____--__-____- X ----P----p to changes X Transient response of load current - -~--~~-~--~-~~_,_ *56 57 _--58 Static on state Control Off-state Harmonic --60 Crosstalk attenuation 21 resistance ~-voltage X X X -_X ------_____ I X - --~__-_______-_-~_______ feedthrough -----------switch isolation distortion - -----------p*59 - *Under consideration. 4 Standard Mark The use of the Standard Mark is governed by the provisions of the Bureau of the Indian Standards, Act, 1986 and the Rules and Regulations made thereunder. 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